Time |
L 01 |
L 02 |
Monday May 31st, 2021 12:40-14:00 |
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A1L-01 Plenary 1 (2 papers) Chr: TBA Track: 7
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Monday May 31st, 2021 14:20-15:40 |
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A2L-01 Plenary 2 (2 papers) Chr: TBA Track: 7
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Tuesday Jun 1st, 2021 12:10-13:25 |
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B1L-01 IGBTs (3 papers) Chr: Shigeto Honda, Yi Tang Track: 1
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Tuesday Jun 1st, 2021 12:10-13:50 |
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| B2L-02 Dynamic Ron & Reliability of p-GaN Gate Technologies (4 papers) Chr: Grace Xing, Yoshinao Miura Track: 4
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Tuesday Jun 1st, 2021 13:45-15:50 |
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B3L-01 ICs for High Efficiency & High Reliability (5 papers) Chr: Kenji Hara, Nicolas Rouger Track: 3
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Tuesday Jun 1st, 2021 14:10-15:50 |
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| B4L-02 SiC Advanced Novel Devices (4 papers) Chr: Andrei Petru Mihaila, Yasuhiko Onishi Track: 5
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Wednesday Jun 2nd, 2021 12:10-13:50 |
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C1L-01 Lateral Low Voltage Devices (4 papers) Chr: Tatsuya Nishiwaki, Hiroki Fujii Track: 2
| C1L-02 SiC Device Ruggedness & Reliability (4 papers) Chr: Siddarth Sundaresan, Hiroshi Kono Track: 5
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Wednesday Jun 2nd, 2021 14:10-15:50 |
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C2L-01 Packaging Technologies: Integrated Modeling & Design (4 papers) Chr: Tomoyuki Miyoshi, Ichiro Omura Track: 6
| C2L-02 Advances on Fin-FETs & Alternative p-type Materials for GaN Devices (4 papers) Chr: Jiun-Lei Yu, Hideyuki Okita Track: 4
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Thursday Jun 3rd, 2021 12:10-13:50 |
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D1L-01 Simulation Analysis for Silicon Vertical Devices (4 papers) Chr: Yuichi Onozawa, Takahiro Mori Track: 1
| D1L-02 Packaging Technologies: Characterization & Reliability (4 papers) Chr: Alberto Castellazzi, Yang Xu Track: 6
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Thursday Jun 3rd, 2021 14:10-15:50 |
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D2L-01 Vertical Low Voltage Devices and Late News (4 papers) Chr: Takahiro Mori, Mark Gajda Track: 2
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