| Time |
L 01 |
L 02 |
Monday
May 31st, 2021
12:40-14:00 |
| |
A1L-01
Plenary 1 (2 papers)
Chr: TBA
Track: 7
| |
Monday
May 31st, 2021
14:20-15:40 |
| |
A2L-01
Plenary 2 (2 papers)
Chr: TBA
Track: 7
| |
Tuesday
Jun 1st, 2021
12:10-13:25 |
| |
B1L-01
IGBTs (3 papers)
Chr: Shigeto Honda, Yi Tang
Track: 1
| |
Tuesday
Jun 1st, 2021
12:10-13:50 |
| |
| | B2L-02
Dynamic Ron & Reliability of p-GaN Gate Technologies (4 papers)
Chr: Grace Xing, Yoshinao Miura
Track: 4
|
Tuesday
Jun 1st, 2021
13:45-15:50 |
| |
B3L-01
ICs for High Efficiency & High Reliability (5 papers)
Chr: Kenji Hara, Nicolas Rouger
Track: 3
| |
Tuesday
Jun 1st, 2021
14:10-15:50 |
| |
| | B4L-02
SiC Advanced Novel Devices (4 papers)
Chr: Andrei Petru Mihaila, Yasuhiko Onishi
Track: 5
|
Wednesday
Jun 2nd, 2021
12:10-13:50 |
| |
C1L-01
Lateral Low Voltage Devices (4 papers)
Chr: Tatsuya Nishiwaki, Hiroki Fujii
Track: 2
| C1L-02
SiC Device Ruggedness & Reliability (4 papers)
Chr: Siddarth Sundaresan, Hiroshi Kono
Track: 5
|
Wednesday
Jun 2nd, 2021
14:10-15:50 |
| |
C2L-01
Packaging Technologies: Integrated Modeling & Design (4 papers)
Chr: Tomoyuki Miyoshi, Ichiro Omura
Track: 6
| C2L-02
Advances on Fin-FETs & Alternative p-type Materials for GaN Devices (4 papers)
Chr: Jiun-Lei Yu, Hideyuki Okita
Track: 4
|
Thursday
Jun 3rd, 2021
12:10-13:50 |
| |
D1L-01
Simulation Analysis for Silicon Vertical Devices (4 papers)
Chr: Yuichi Onozawa, Takahiro Mori
Track: 1
| D1L-02
Packaging Technologies: Characterization & Reliability (4 papers)
Chr: Alberto Castellazzi, Yang Xu
Track: 6
|
Thursday
Jun 3rd, 2021
14:10-15:50 |
| |
D2L-01
Vertical Low Voltage Devices and Late News (4 papers)
Chr: Takahiro Mori, Mark Gajda
Track: 2
| |
