The Modernization of Quality & Reliability: Testing Methods & Benchmarks for GaN and SiC Semiconductors Session
Session Type: Lecture
Session Code: IS23
Location: R07
Date & Time: Thursday March 19, 2020 (08:30 - 11:25)
Chair: Jeff Casady,
Primit Parikh

 

    Papers are listed in the order they will be presented.

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My Sched		Paper
Id		TopicTitle/Author
3543 1 Extreme Reliability and Test to Fail Methodology for GaN Devices
Alex Lidow, Robert Strittmatter
3544 1 Best Practices Using Voltage Acceleration for Reliability Testing of High Voltage GaN
Ronald Barr, Yifeng Wu
3545 1 Selected Topics on Power GaN and SiC Reliability
Sameh Khalil
3546 1 JEDEC JC-70 Datasheet, Qualification, and Test Standards for Wide Bandgap: Progress and Impact
Stephanie Butler, Peter Friedrichs
3547 1 SiC MOSFET Reliability for EV Drivetrain
Don Gajewski, Brett Hull
3548 1 GaN Systems Demonstrates Reliability Based on Qualification and Lifetime Data
Dr. Maryam Abouie