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The Modernization of Quality & Reliability: Testing Methods & Benchmarks for GaN and SiC Semiconductors Session |
Session Type: | Lecture |
Session Code: | IS23 |
Location: | R07 |
Date & Time: | Thursday March 19, 2020 (08:30 - 11:25) |
Chair: | Jeff Casady, Primit Parikh |
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Papers are listed in the order they will be presented.
Paper Id | Topic | Title/Author |
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3543 |
1 |
Extreme Reliability and Test to Fail Methodology for GaN Devices Alex Lidow, Robert Strittmatter |
3544 |
1 |
Best Practices Using Voltage Acceleration for Reliability Testing of High Voltage GaN Ronald Barr, Yifeng Wu |
3545 |
1 |
Selected Topics on Power GaN and SiC Reliability Sameh Khalil |
3546 |
1 |
JEDEC JC-70 Datasheet, Qualification, and Test Standards for Wide Bandgap: Progress and Impact Stephanie Butler, Peter Friedrichs |
3547 |
1 |
SiC MOSFET Reliability for EV Drivetrain Don Gajewski, Brett Hull |
3548 |
1 |
GaN Systems Demonstrates Reliability Based on Qualification and Lifetime Data Dr. Maryam Abouie |
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