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Special Sessions: State-of-the-Art Solutions for IC Testing Session |
Session Type: | Lecture |
Session Code: | C2L-A |
Location: | Room VR1 |
Date & Time: | Friday June 19, 2020 (10:40 - 11:40) |
Chair: | None |
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Papers are listed in the order they will be presented.
Paper Id | Topic | Title/Author |
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5097 |
16.2 |
Static Linearity BIST for Vcm-Based Switching SAR ADCs Using a Reduced-Code Measurement Technique Renato Feitoza, Manuel J. Barragan, Antonio Gines, Salvador Mir |
5171 |
16.2 |
Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters Ahmed Emara, Gordon Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida |
5179 |
16.2 |
Accelerating STT-MRAM Ramp-Up Characterization Govind Radhakrishnan, Youngki Yoon, Manoj Sachdev |
5174 |
16.2 |
On the Importance of Bias-Dependent Charge Injection for SET Evaluation in AMS Circuits Valentin Gutierrez, Gildas Leger |
5042 |
16.2 |
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit Sarah Azimi, Corrado De Sio, Weitao Yang, Luca Sterpone |
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